TCAD
Li Jin-Xian
Test Engineer And DQA Engineer
Taoyuan City
Summary
Detail-oriented Test Engineer experienced in test documentation, functional testing, and automation tools. Achieved improvements in testing efficiency through comprehensive test plans and effective collaboration with development teams. Focused on enhancing software quality and team capabilities while implementing cost-effective testing methods.
Overview
3
3
Certifications
4
4
years of professional experience
Work History
Test Engineer and DQA Engineer
Delta
03.2022 - Current
- Documented test plans, procedures, results, and defect tracking databases, ensuring accuracy for audits and future reference.
- Developed comprehensive test plans and use cases to align with testing objectives and enhance testing effectiveness.
- Collaborated with development teams to identify, reproduce, and resolve hardware and software issues promptly.
- Reviewed, evaluated, and identified requirements for testability.
- Mentored junior team members, promoting best practices in test engineering techniques and tools to elevate team capabilities.
- Customized testing environments for specific project needs, facilitating more accurate test results.
- Mentored junior team members, sharing best practices in test engineering techniques and tools usage.
Education
Master of Science - Semiconductor
National Yunlin University of Science And Technology
Yunlin, Taiwan 04.2001 -
Bachelor of Science - Electronic Engineering
National United University
Miaoli 04.2001 -
Skills
Manual testing
Creating test cases
Functional testing
Test execution
System testing
Test documentation
Automation tools
Debugging
Data analysis
TCAD simulation tools
Semiconductor technologies
IC layout tools
Accomplishments
Honors & Awards:
Gold Medal, 2019 International Innovation and Invention Competition (10th IIIC)
Silver Medal, 2020 International Innovation and Invention Competition (11th IIIC)
Journal paper:
Chih-Chieh Hsu*, Jin-Xian Li, Po-Tsung Chen, and Mojtaba Joodaki, “Performance dependence of self-aligned dual-gate poly-Si TFTs on localized defective regions,” Semiconductor Science and Technology, vol. 35, no. 8, pp. 085027-1-085027-8, May 2020.
Chih-Chieh Hsu*, Jin-Xian Li, Po-Cheng Huang, Wun-Ciang Jhang, and Mojtaba Joodaki, "Study of Electrical Characteristics for Dual-Gate TFTs With Asymmetric Defect Distributions and Gate Work Functions," IEEE Transactions on Electron Devices, Volume: 70, Issue: 6, pp. 3390 - 3393, June 2023
Conference paper:
Chih-Chieh Hsu*, Jin-Xian Li, and Po-Tsung Chen, “Correlation between electric field distribution and grain boundaries for a dual-gate poly-Si TFT,” 3rd IEEE International Conference on Knowledge Innovation and Invention (IEEE ICKII 2020), August 21-23, 2020, Kaohsiung, Taiwan.
Software
Laker
ATS
Certification
Class B Technician for Digital Electronics, Workforce Development Agency
Interests
Baseball
Traveling
Timeline
Test Engineer and DQA Engineer
Delta
03.2022 - Current
Class B Technician for Digital Electronics, Workforce Development Agency
12-2014
Class C Technician for Industrial Electronics, Workforce Development Agency
07-2013
Class C Technician for Computer Hardware Identification and Maintenance
03-2013
Master of Science - Semiconductor
National Yunlin University of Science And Technology
04.2001 -
Bachelor of Science - Electronic Engineering
National United University
04.2001 -