Highly motivated semiconductor professional with 5.1 years of experience in process diagnostics and control , possessing extensive expertise with Inspection and Review tools .
Integrated inspection tools with data analysis to enhance defect detection and better quality control
Analyzed historical process data to identify trends, root causes, and optimization opportunities, leading to measurable improvements in yield and throughput.
Deployed machine learning models to predict and control critical process parameters, improving manufacturing efficiency and reducing downtime
Committed to staying abreast of industry advancements and provide a competitive edge in the dynamic semiconductor landscape by using my domain expertise.
Semi-Conductor Process Knowledge