Matthew Lee

My work is mainly divided into three parts: yield data collection and maintenance, new IC test project development, and legacy IC test platform migration.

Yield data collection and maintenance are part of my daily responsibilities. I regularly collect and analyze yield data, and when the testing facility encounters low yield issues or machine setup failures, I promptly diagnose and resolve the problems to ensure stable production.

New IC test development requires close collaboration with RD (R&D engineers) and AE (Application Engineers). The process includes designing test circuit boards for new specifications, writing test programs, reviewing data with RD to ensure accuracy, fine-tuning at the testing facility, and preparing the Release Form for mass production. Once the project enters production, I continue to monitor yield performance and optimize the process as needed.

Legacy IC test platform migration follows a similar process. Our company still operates on some older platforms (e.g., ASL1000, SX1600), but since the original manufacturers no longer provide support and the equipment has aged significantly, we transition these IC tests to platforms like ACCO or HZCC. This initiative not only aligns with long-term planning but also helps reduce testing costs. This has been a major focus of my projects and is the area where I have learned the most.